Ichiro Ohnishi
JEOL Ltd., TOKYO, Japan
- This delegate is presenting an abstract at this event.
Presentations this author is a contributor to:
Atomic resolution observations for beam-sensitive asbestos samples using low-dose STEM imaging techniques (113973)
3:15 PM
Ichiro Ohnishi
MS01 - Minerals, Mineralogy & Metallurgy (Afternoon)
Optical Sectioning Microscopy by Scanning Transmission Electron Microscope equipped with aberration corrector (114192)
3:15 PM
Hiroki Hashiguchi
PS01 - Exploring the Depths: Advances in 3D Microscopy