Eiji Okunishi — ASN Events
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  2. Eiji Okunishi

Eiji Okunishi

JEOL Ltd., TYO, Japan

  • This delegate is presenting an abstract at this event.
I am assistant general manager of EM Business unit in JEOL Ltd. I received a PhD degree in Engineering Department from Kyushu University in 2012.I joined JEOL in 1998. My main work is Research of TEM Application and development of TEM instrument. I designed application part of JEM-ARM200F and Annular Bright Field(ABF) imaging for visualization of light element atomic site [M&M:2009],[Micron:2012].
Presentations this author is a contributor to:

Optical Sectioning Microscopy by Scanning Transmission Electron Microscope equipped with aberration corrector (114192)

3:15 PM
Hiroki Hashiguchi
PS01 - Exploring the Depths: Advances in 3D Microscopy

Extension of TEM/STEM Function by using PythonⓇ scripting (114431)

12:45 PM
Eiji Okunishi
PS08 - Open Source (public license) tools in microscopy