Felix Theska
The University of Sydney, NSW, Australia
- This delegate is presenting an abstract at this event.
Presentations this author is a contributor to:
High-Throughput Specimen Preparation using Automated Focused Ion Beam Patterning (114826)
12:45 PM
Felix Theska
PS02 - Atomic Resolution Microscopy & Microanalysis (Monday)
Rapid 3D Characterisation of Grain Boundaries at the Atomic-Scale Using Atom Probe Tomography (115800)
4:15 PM
Andrew J Breen
PS01 - Exploring the Depths: Advances in 3D Microscopy