Advanced Surface Characterisation of Minerals using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) — ASN Events

Advanced Surface Characterisation of Minerals using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) — ASN Events

Advanced Surface Characterisation of Minerals using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Advanced Surface Characterisation of Minerals using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) (114583)

Susana Brito e Abreu ¹

JKMRC, Indooroopilly, QLD, Australia

Authors contributing to this presentation.

Brito e Abreu, S

Susana's research focuses on mineral processing with especial interest in understanding the complex interplay between ore mineralogy, mineral surface properties and process behaviour. She specialises in the application of surface characterisation techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in mineral comminution and flotation studies to identify the key chemistry drivers of process behaviour. She is developing advanced tools by integrating ToF-SIMS, X-ray Photoelectron Spectroscopy, X-ray Tomography, Mineral Liberation Analysis and X-ray Fluorescence towards a more comprehensive and faster characterisation of minerals.