Image sharpening by the ES-Corrector for TEM observation of specimen in-liquid — ASN Events

Image sharpening by the ES-Corrector for TEM observation of specimen in-liquid — ASN Events

Image sharpening by the ES-Corrector for TEM observation of specimen in-liquid

Image sharpening by the ES-Corrector for TEM observation of specimen in-liquid (114358)

Hiroki Kawamoto ¹ , Akiko Wakui ¹ , Keiji Tamura ¹ , Marina Wayama ¹ , Yasuyuki Nodera ¹ , Eiko Nakazawa ¹

Hitachi High-Tech Corporation, Hitachinaka-shi, IBARAKI-KEN, Japan

Authors contributing to this presentation.

Kawamoto, H

After earning a Ph.D. in Plant Morphology from the University of Tokyo, Hiroki kawamoto has been actively involved in the reseach and development of electron microscopes at Hitachi High-Tech.

Wakui, A

Tamura, K

Wayama, M

Nodera, Y

Nakazawa, E