Electric Fields at Semiconductor Interfaces by momentum-resolved 4D STEM: towards Correlation with Device Characteristics (115533)

1:45 PM

Kerstin Volz

Low-dose STEM Data Acquisition at Atomic-scale via Optimum Bright-field Imaging (114720)

2:15 PM

Kousuke Ooe

Revealing local atomic re-arrangements in the shear-bands of deformed metallic glasses using scanning electron nano-diffraction (114432)

2:45 PM

Huyen Pham

Development of Quantitative Atomic Vibrational STEM Imaging Technique with a Pixelated Detector (114687)

3:00 PM

Koudai Tabata

Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors (115655)

3:15 PM

Wei Chao

Unsupervised Deep Denoising for Low-Dose 4D-STEM (114427)

3:30 PM

Alireza Sadri

Development of 5D-STEM method to realize simultaneous observation of dynamical and structural heterogeneities (114746)

3:45 PM

Katsuaki Nakazawa

Probing the medium-range order of amorphous materials via the pair-angle distribution function technique (114437)

3:50 PM

Andrew V Martin

Measuring Vacancy Concentrations, Lattice Contraction and Bonding-Sensitive Structure Factors Surrounding Aluminium Nanovoids. (114725)

3:55 PM

Philip NH Nakashima