<em> Evolution of Metrological Tools for Computationally Mediated X-ray and Electron Spectroscopy in</em> <em>Today's Aberration Corrected Analytical Electron Microscopes.</em> — ASN Events

 Evolution of Metrological Tools for Computationally Mediated X-ray and Electron Spectroscopy in Today's Aberration Corrected Analytical Electron Microscopes. (112491)

Nestor J Zaluzec 1
  1. Pritzker School of Molecular Engineering , University of Chicago / Argonne National Lab, Chicago, IL, United States