- Schedule
- ID03 - Application of Microanalysis (Afternoon)
- Evolution of Metrological Tools for Computationally Mediated X-ray and Electron Spectroscopy in Today's Aberration Corrected Analytical Electron Microscopes.
- Evolution of Metrological Tools for Computationally Mediated X-ray and Electron Spectroscopy in Today's Aberration Corrected Analytical Electron Microscopes.