Ying Liu specializes in the design, fabrication, microstructure characterisation, and properties of materials, especially ferroelectric and antiferroelectric materials. She gained her PhD in Materials Science and Engineering from the Institute of Metal Research (IMR), Chinese Academy of Sciences (CAS) in 2017. During her doctoral studies, she focused on designing and studying the ferroelectric domains, interfaces, and defects in ferroelectric thin films using pulsed laser deposition and advanced aberration-corrected transmission electron microscopy techniques (Cs-corrected TEM). Following her PhD, Ying Liu worked as a Postdoctoral Research Associate at the Australia Centre for Microscopy and Microanalysis (ACMM) at the University of Sydney (USyd), and later as a PROBIST postdoctoral fellow (co-funded Marie Curie fellow), at the Catalan Institute of Nanoscience and Nanotechnology (ICN2) in Barcelona, Spain. Enriched by her postdoctoral experience, she has broadened her research to the mechanical properties of various materials at the micro and nano-scale, as well as the relationship between the microstructure and properties of relaxor ferroelectrics and antiferroelectrics. This advancement is supported by her proficiency in in-situ straining, biasing, and heating TEM, pulsed laser deposition (PLD), scanning electron microscopy (SEM), scanning probe microscopy (SPM), and focused ion beam techniques (FIB).