<em>Interference of Polarized Electron Beam in Transmission Electron Microscopy</em> — ASN Events

Interference of Polarized Electron Beam in Transmission Electron Microscopy (114490)

Makoto Kuwahara 1 , Satoshi Ogawa 1 , Hideo Morishita 2 , Tsunenori Nomaguchi 3 , Toshihide Agemura 3
  1. Nagoya University, Nagoya City, AICHI PREFECTURE, Japan
  2. Research and Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
  3. Hitachi High-Tech Corporation, Hitachinaka, Ibaraki, Japan