In-situ Annealing Effect on the Fe L-edge Spectral Features in Submicron La<sub>0.2</sub>Ce<sub>0.8</sub>Fe<sub>10.5</sub>Si<sub>2.5</sub> Particles Investigated by Scanning Transmission X-ray Microscopy — ASN Events
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  3. In-situ Annealing Effect on the Fe L-edge Spectral Features in Submicron La0.2Ce0.8Fe10.5Si2.5 Particles Investigated by Scanning Transmission X-ray Microscopy

In-situ Annealing Effect on the Fe L-edge Spectral Features in Submicron La0.2Ce0.8Fe10.5Si2.5 Particles Investigated by Scanning Transmission X-ray Microscopy (114077)

Hansol Jang 1 , Dong Hyun Kim 1 , Young-Sang Yu 1 , Jong Won Byun 2 , Nam Dong Kim 2 , Hyun-Joon Shin 1
  1. Chungbuk National University, Cheongju, CHUNGCHUNGBUKDO, South Korea
  2. Beamline Division, Pohang Accelerator Laboratory, Pohang, Kyungbuk, South Korea