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Presentations this author is a contributor to:
Deep Learning-based Electron Ptychographic Imaging under Anomalous Electron-Sample Interactions (114312)
12:55 PM
Han Yue
ID01 - Image Analysis, Data Handling, Big Data & AI
Direct observation of single-atom defects and lattice mismatches through top-view measurements using electron ptychography (116986)
1:45 PM
Chien-Chun Chen
MS02 - Nano-materials & Nano-structures (Afternoon)