Direct observation of single-atom defects and lattice mismatches through top-view measurements using electron ptychography — ASN Events
  1. Schedule
  2. MS02 - Nano-materials & Nano-structures (Afternoon)
  3. Direct observation of single-atom defects and lattice mismatches through top-view measurements using electron ptychography

Direct observation of single-atom defects and lattice mismatches through top-view measurements using electron ptychography (116986)

Chien-Chun Chen 1
  1. National Tsing-Hua University, East Dist, HSINCHU CITY, Taiwan