Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials — ASN Events

Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials — ASN Events

Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials

Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials (114374)

Hrishikesh Bale ¹ , Nathan Johnson ¹ , Bernd Schulz ² , Feng Lin Ng ³

ZEISS Research Microscopy Solutions, Dublin, CA
Carl Zeiss Pty Ltd, Australia
Carl Zeiss Pte. Ltd, Singapore, SINGAPORE

Authors contributing to this presentation.

Bale, H

Johnson, N

Schulz, B

Bernd Schulz oversees the Materials Science portfolio at ZEISS Australia and New Zealand. He holds a PhD from UNSW Sydney and has over a decade experience as Materials Scientist within academic research and the manufacturing industry.

Ng, F