Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials (114374)

12:35 PM

Bernd Schulz

MS01 - Minerals, Mineralogy & Metallurgy (Morning)

The Application of Deep Learning Technology to Automated Petrography Workflows (114375)

4:55 PM

Feng Lin Ng

MS/ID Poster Session

Large Wide Cross-Sections of a Crystal Oscillator Prepared with a Femtosecond Laser for SEM Imaging & EDX Analysis (114378)

3:45 PM

Bernd Schulz

ID03 - Application of Microanalysis (Afternoon)

Revealing Microstructural Complexity in Advanced Battery Systems with Connected and Correlative Microscopy Workflows (114379)

5:20 PM

Feng Lin Ng

MS/ID Poster Session

Low to Ultra-low kV SEM Imaging of Non-Conductive and Beam Sensitive Biomaterials (114380)

12:15 PM

Feng Lin Ng

MS07 - Soft Materials and Beam Sensitive Materials

The FIB-SEM Microscope with an Integrated fs-laser for the Atom Probe Tomography (APT) and (scanning) Transmission Electron Microscopy (TEM/STEM) Sample Preparation (114384)

4:30 PM

Feng Lin Ng

Physical Sciences Poster Session