<em></em>Pushing the Limits of Fine Feature Detection in 3D X-ray Microscopy: Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites — ASN Events
  1. Schedule
  2. Physical Sciences Poster Session
  3. Pushing the Limits of Fine Feature Detection in 3D X-ray Microscopy: Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites

Pushing the Limits of Fine Feature Detection in 3D X-ray Microscopy: Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites (114383)

Feng Lin Ng 1 , Luna Zhang 1 , Hrishikesh Bale 2 , Kaushik Yanamandra 2 , Bernd Schulz 3
  1. Carl Zeiss Pte. Ltd, Singapore, SINGAPORE
  2. ZEISS Research Microscopy Solutions, Dublin, CA
  3. Carl Zeiss Pty Ltd, Australia