Maximizing 3D X-ray Microscopy Data Fidelity and Throughput with Novel Deep Learning Assisted Reconstruction Algorithms (114381)
4:30 PM
Pushing the Limits of Fine Feature Detection in 3D X-ray Microscopy: Characterization of Hierarchical Microstructures in TiC Reinforced Nickel Matrix Composites (114383)
4:30 PM
Insights into the Screw-Dislocation Mediated Growth Mechanism in Double Shell Heterostructures of Bi2Te3-Sb2Te3-Bi2Te3: A STEM Study (113871)
4:30 PM
The FIB-SEM Microscope with an Integrated fs-laser for the Atom Probe Tomography (APT) and (scanning) Transmission Electron Microscopy (TEM/STEM) Sample Preparation (114384)
4:30 PM
Insights into Hydrogen Embrittlement of Nickel Single Crystal Superalloys (114658)
4:30 PM
A Comparative Study of TEM Specimen Preparation: FIB vs. Tripod and PIPS Techniques (115361)
4:30 PM
Charge density analysis of strontium titanate using quantitative convergent-beam electron diffraction (114392)
4:30 PM
Application of 4D-STEM on battery materials (114465)
4:30 PM
Crystal Structure and Charge Density Analysis at Twin Boundary using Multiple Convergent-beam Electron Diffraction Patterns (114555)
4:30 PM
Contrast Optimization Aided by Machine Learning Applied to Virtual 4D-STEM Images (114582)
4:40 PM
Camera Systems and Software for Fast 4DSTEM Data Acquisition and Live Virtual Detector Calculation (114755)
4:40 PM
TEM observation of mirror-microscopy detected epitaxial SiC defects and dynamic structural transitions using an FIB compatible MEMS specimen heating holder (114356)
4:40 PM
Study of Phase Analysis by Electron Holography in ETEM (114453)
4:40 PM
Can Computational Phase Retrieval Help 2D Classification in Cryo-EM? (114688)
4:40 PM
Microscopy Implementation and Training Pathways in Core Microscopy Facility (114822)
4:40 PM