Crystal Structure and Charge Density Analysis at Twin Boundary using Multiple Convergent-beam Electron Diffraction Patterns — ASN Events

Crystal Structure and Charge Density Analysis at Twin Boundary using Multiple Convergent-beam Electron Diffraction Patterns — ASN Events

Crystal Structure and Charge Density Analysis at Twin Boundary using Multiple Convergent-beam Electron Diffraction Patterns

Crystal Structure and Charge Density Analysis at Twin Boundary using Multiple Convergent-beam Electron Diffraction Patterns (114555)

Daisuke D Morikawa ¹ , Tianyu T Liu ¹ , Kenji K Tsuda ¹

IMRAM, Tohoku University, Sendai, MIYAGI, Japan

Authors contributing to this presentation.

Morikawa, D.D

Liu, T.T

Tsuda, K.K