Dr. Jiangtao Qu is a Transmission Electron Microscopy (TEM) specialist at Sydney Microscopy and Microanalysis, University of Sydney. He completed his PhD at the University of Sydney in 2018 and subsequently worked as a postdoctoral research associate for three years in the same organisation. Apart from the TEM instrument maintenance and user training, he also carried out researches focusing on the atomic-scale characterization of functional nanomaterials, including nanoparticles and nanowires. Through advanced microscopic techniques such as Atom Probe Tomography (APT), Transmission Electron Microscopy (TEM), and Scanning Electron Microscopy/Focused Ion Beam (SEM/FIB), he investigates the structure-property relationships of these materials.