Chairs: Scott Findlay & Rong Yu
Imaging Point Defects in Bulk Crystals Using Multislice Electron Ptychography (115002)
4:30 PM
Breaking Resolution Limits with Ptychography using Topological Materials (114837)
5:00 PM
Transfer of Information Across Various Phase Retrieval STEM Techniques (114670)
5:30 PM
Information Transfer Improvement by Parallax Correction and Ptychography Reconstruction Applied to Fast Large-Area 4D STEM Experiments (114584)
5:45 PM
Full-Field Illumination Ptychography Using a Structured Electron Beam (114624)
6:00 PM