EELS at Extreme Energy Losses (XEELS<sup> TM</sup>); an Opportunity to Obtain X-ray Absorption Spectroscopy-like Information Using an Electron Microscope — ASN Events
  1. Schedule
  2. PS06 - Advances in X-ray spectromicroscopy (Morning)
  3. EELS at Extreme Energy Losses (XEELS TM); an Opportunity to Obtain X-ray Absorption Spectroscopy-like Information Using an Electron Microscope

EELS at Extreme Energy Losses (XEELS TM); an Opportunity to Obtain X-ray Absorption Spectroscopy-like Information Using an Electron Microscope (114389)

Sorin Lazar 1 , Peter Tiemeijer 1 , Claudia S Schnohr 2 , Maria Meledina 1 , Thomas Hoeche 3 , Paolo Longo 1 , Bert Freitag 1
  1. Thermo Fisher, Eindhoven, NB, Netherlands
  2. Felix Bloch Institute for Solid State Physics, Leipzig
  3. Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS Walter-Hülse-Straße , Halle