Characterization of single atom using synchrotron X-ray tunneling microscopy (SX-STM) and beyond — ASN Events

Characterization of single atom using synchrotron X-ray tunneling microscopy (SX-STM) and beyond (114760)

Xiaopeng Li 1
  1. Shanghai Institute of Organic Chemistry/Shenzhen University, Shenzhen, GUANGDONG, China